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X RITE ATS40 SCANNENDES SPEKTRALPHOTOMETERSYSTEM

2776

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Measuring Devices |

Short description

X RITE ATS40 SCANNENDES SPEKTRALPHOTOMETERSYSTEM

Price (in €)

on request

Manufacturer

X Rite+GretagMacbeth

Model

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Year of manufacture

0000

Warranty until

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Long description

SCANNING X RITE ATS40 SPECTRAL PHOTO METRE SYSTEM

SCANNING X RITE ATS40 SPECTRAL PHOTO METRE

Spectral scan measuring head DRS with 45 Â°/0 Â° measuring geometry (German Institute for Standardization 5033)
Spectral measurement in 10nm intervals from 400 700nm
Auto Tracking function to automatic discovering and recognising of pressure controlling stripe on the curve
automatic calibration (Kalibrierstandards built in)
Curve fixation with Vakuumansaugung
the smallest measuring field size 3.8 mm * 5 mm (measuring surface 3 mm * 3.5 mm)
maximum scan width 102 cm
Measurement from up to 8 measuring stripes within 38 mm of the Bogenkante
maximum paper thickness 1.5 mm
Scan speed 150 mm / see with measuring field width 4.7 mm

SOFTWARE X RITE ATS

Windows 98 / use NT with an easy service (routine company: Measuring release about key in the device)
usable for several print orders / machines at the same time
Data bank with Pan tone colours, production of own colour libraries
extensive on line help
freely determinable pressure controlling stripes and measuring missions
graphic representation from densitometrischen and colour metrical measuring data
Trend representations after zonal screws, to to curve curve trend
freely determinable tolerance borders (colour metrical / densitometrisch)
Production of reports (Crystal Reports format)
Import and export of measuring data and measuring missions
bidirectional serial communication between spectral photo metre and PC

Weight

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Dimensions (LxWxH)

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Location

Germany

Region

NRW

View this article on the vendor's web site.

Buying:

X RITE ATS40 SCANNENDES SPEKTRALPHOTOMETERSYSTEM

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